CPE Details
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CPE Name: cpe:2.3:h:qualcomm:sm7635:-:*:*:*:*:*:*:*
Informations
Vendor
qualcommProduct
sm7635Version
-Related CVE
| CVE ID | Published | Description | Score | Severity |
|---|---|---|---|---|
| Transient DOS may occur while processing the country IE. | 7.5 |
High |
||
| Memory corruption in display driver while detaching a device. | 7.8 |
High |
||
| Memory corruption may occur while validating ports and channels in Audio driver. | 7.8 |
High |
||
| Information disclosure while deriving keys for a session for any Widevine use case. | 5.5 |
Medium |
||
| While processing the authentication message in UE, improper authentication may lead to information disclosure. | 5.4 |
Medium |
||
| Memory corruption while processing IOCTL from user space to handle GPU AHB bus error. | 7.8 |
High |
||
| Memory corruption during management frame processing due to mismatch in T2LM info element. | 9.8 |
Critical |
||
| Information disclosure while parsing the OCI IE with invalid length. | 8.2 |
High |
||
| Memory corruption while power-up or power-down sequence of the camera sensor. | 7.8 |
High |
||
| Memory corruption can occur in the camera when an invalid CID is used. | 7.8 |
High |
||
| Memory corruption can occur when a compat IOCTL call is followed by a normal IOCTL call from userspace. | 7.8 |
High |
||
| Memory corruption while validating number of devices in Camera kernel . | 7.8 |
High |
||
| Memory corruption may occour occur when stopping the WLAN interface after processing a WMI command from the interface. | 7.8 |
High |
||
| Memory corruption while parsing the ML IE due to invalid frame content. | 9.8 |
Critical |
||
| Transient DOS can occur when the driver parses the per STA profile IE and tries to access the EXTN element ID without checking the IE length. | 7.5 |
High |
||
| Memory corruption can occur when process-specific maps are added to the global list. If a map is removed from the global list while another thread is using it for a process-specific task, issues may arise. | 7.8 |
High |
The information presented on CVE Find originates from several carefully selected reference sources. CVE data is provided by MITRE Corporation and the National Vulnerability Database (NVD). The Known Exploited Vulnerabilities (KEV) catalog is sourced from the Cybersecurity and Infrastructure Security Agency (CISA), while EPSS scores come from FIRST.org. Additionally, data regarding software weaknesses (CWE) and common attack patterns (CAPEC) is maintained by MITRE Corporation, and information on hardware and software configurations (CPE) is provided by the NVD.