The hardware designer may improperly anticipate hardware behavior when exposed to exceptionally cold conditions. As a result they may introduce a weakness by not accounting for the modified behavior of critical components when in extreme environments.
An example of a change in behavior is that power loss won't clear/reset any volatile state when cooled below standard operating temperatures. This may result in a weakness when the starting state of the volatile memory is being relied upon for a security decision. For example, a Physical Unclonable Function (PUF) may be supplied as a security primitive to improve confidentiality, authenticity, and integrity guarantees. However, when the PUF is paired with DRAM, SRAM, or another temperature sensitive entropy source, the system designer may introduce weakness by failing to account for the chosen entropy source's behavior at exceptionally low temperatures. In the case of DRAM and SRAM, when power is cycled at low temperatures, the device will not contain the bitwise biasing caused by inconsistencies in manufacturing and will instead contain the data from previous boot. Should the PUF primitive be used in a cryptographic construction which does not account for full adversary control of PUF seed data, weakness would arise.
This weakness does not cover "Cold Boot Attacks" wherein RAM or other external storage is super cooled and read externally by an attacker.
Scope | Impact | Likelihood |
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Integrity Authentication | Varies by Context, Unexpected State Note: Consequences of this weakness are highly contextual. | Low |
CAPEC-ID | Attack Pattern Name |
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CAPEC-624 | Hardware Fault Injection The adversary uses disruptive signals or events, or alters the physical environment a device operates in, to cause faulty behavior in electronic devices. This can include electromagnetic pulses, laser pulses, clock glitches, ambient temperature extremes, and more. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. |
CAPEC-625 | Mobile Device Fault Injection Fault injection attacks against mobile devices use disruptive signals or events (e.g. electromagnetic pulses, laser pulses, clock glitches, etc.) to cause faulty behavior. When performed in a controlled manner on devices performing cryptographic operations, this faulty behavior can be exploited to derive secret key information. Although this attack usually requires physical control of the mobile device, it is non-destructive, and the device can be used after the attack without any indication that secret keys were compromised. |
Name | Organization | Date | Date release | Version |
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Paul A. Wortman | Wells Fargo | 4.5 |
Name | Organization | Date | Comment |
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CWE Content Team | MITRE | updated Relationships | |
CWE Content Team | MITRE | updated Relationships | |
CWE Content Team | MITRE | updated References, Related_Attack_Patterns | |
CWE Content Team | MITRE | updated Related_Attack_Patterns | |
CWE Content Team | MITRE | updated Relationships | |
CWE Content Team | MITRE | updated Mapping_Notes |